Long-term Safety and Reliability of Neural Implants
Dr. Victor Krauthamer, PI, in collaboration with Dr. Jack Judy, Defense Advanced Research Projects Agency (DARPA)
This work is developing test methods and evaluation of the long-term safety and reliability of devices implanted in the nervous system. It includes in vitro and animal testing for assessing long-term safety/reliability of implants. In addition it will provide testing and verification of new research products from DARPA. Our two major tasks are: (1) Development of evaluation of test methods for long-term safety and reliability of neurological implants. These methods are based on the expertise and program area of Division of Physics staff and include techniques for assessing device reliability and tissue reactions through functional measurements, advanced imaging and computer-aided histology. (2) Testing and verification of technical advances from the DARPA program in “Reliable Neural Interface Technology” for long-term safety and effectiveness.